Købe SN74ABT18640DLRG4 med BYCHPS
Køb med garanti
SN74ABT18640DLRG4
- Varenummer:
- SN74ABT18640DLRG4
- Fabrikant:
- Beskrivelse:
- IC SCAN TEST DEVICE 18BIT 56SSOP
- Blyfri Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgængelig mængde:
- 15797 Pieces
- Datablad:
- SN74ABT18640DLRG4.pdf
Introduktion
BYCHIPS er strømforsyningsdistributøren for SN74ABT18640DLRG4, vi har lagrene til omgående forsendelse og også tilgængelig for lang tid levering. Send venligst din købsplan til SN74ABT18640DLRG4 via e-mail, vil vi give dig den bedste pris i henhold til din plan.
specifikationer
| Forsyningsspænding: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Device Package: | 56-SSOP |
| Serie: | 74ABT |
| Emballage: | Tape & Reel (TR) |
| Pakke / tilfælde: | 56-BSSOP (0.295", 7.50mm Width) |
| Driftstemperatur: | -40°C ~ 85°C |
| Antal bitter: | 18 |
| Monteringstype: | Surface Mount |
| Fugtfølsomhedsniveau (MSL): | 1 (Unlimited) |
| Producentens varenummer: | SN74ABT18640DLRG4 |
| Logik Type: | Scan Test Device with Inverting Bus Transceivers |
| Udvidet beskrivelse: | Scan Test Device with Inverting Bus Transceivers IC 56-SSOP |
| Beskrivelse: | IC SCAN TEST DEVICE 18BIT 56SSOP |
| Email: | [email protected] |
Relaterede dele til SN74ABT18640DLRG4
| Billede | Varenummer | producenter | Beskrivelse | Udsigt |
|---|---|---|---|---|
|
SN74ABT18640DL | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | Forespørgsel |
|
SN74ABT18646PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Forespørgsel |
|
SN74ABT18652PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Forespørgsel |
|
SN74ABT18640DLR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | Forespørgsel |
|
SN74ABT18504PMR | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørgsel |
|
SN74ABT18640DGGR | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | Forespørgsel |
|
SN74ABT18504PMG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørgsel |
|
SN74ABT18245ADL | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | Forespørgsel |
|
SN74ABT18504PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørgsel |
|
SN74ABT18245ADGGR | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | Forespørgsel |
Laast News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI to reduce costs in Wireless business; OMAP™ processors and wireless connectivity solutions will focus on embedded markets
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers