Købe SN74BCT8244ADWR med BYCHPS
Køb med garanti
SN74BCT8244ADWR
- Varenummer:
- SN74BCT8244ADWR
- Fabrikant:
- Beskrivelse:
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Blyfri Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgængelig mængde:
- 12277 Pieces
- Datablad:
- SN74BCT8244ADWR.pdf
Introduktion
BYCHIPS er strømforsyningsdistributøren for SN74BCT8244ADWR, vi har lagrene til omgående forsendelse og også tilgængelig for lang tid levering. Send venligst din købsplan til SN74BCT8244ADWR via e-mail, vil vi give dig den bedste pris i henhold til din plan.
specifikationer
| Forsyningsspænding: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Device Package: | 24-SOIC |
| Serie: | 74BCT |
| Emballage: | Tape & Reel (TR) |
| Pakke / tilfælde: | 24-SOIC (0.295", 7.50mm Width) |
| Andre navne: | SN74BCT8244ADWRE4 SN74BCT8244ADWRE4-ND SN74BCT8244ADWRG4 SN74BCT8244ADWRG4-ND |
| Driftstemperatur: | 0°C ~ 70°C |
| Antal bitter: | 8 |
| Monteringstype: | Surface Mount |
| Fugtfølsomhedsniveau (MSL): | 1 (Unlimited) |
| Producentens varenummer: | SN74BCT8244ADWR |
| Logik Type: | Scan Test Device with Buffers |
| Udvidet beskrivelse: | Scan Test Device with Buffers IC 24-SOIC |
| Beskrivelse: | IC SCAN TEST DEVICE BUFF 24-SOIC |
| Email: | [email protected] |
Relaterede dele til SN74BCT8244ADWR
| Billede | Varenummer | producenter | Beskrivelse | Udsigt |
|---|---|---|---|---|
|
SN74BCT8244ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørgsel |
|
SN74BCT8245ADWR | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Forespørgsel |
|
SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørgsel |
|
SN74BCT8240ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørgsel |
|
SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørgsel |
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørgsel |
|
SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Forespørgsel |
|
SN74BCT8244ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørgsel |
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørgsel |
|
SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Forespørgsel |
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørgsel |
|
SN74BCT8240ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørgsel |
|
SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørgsel |
|
SN74BCT8245ADW | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Forespørgsel |
Laast News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog