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SN74BCT8374ADW
- Varenummer:
- SN74BCT8374ADW
- Fabrikant:
- Beskrivelse:
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Blyfri Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgængelig mængde:
- 12626 Pieces
- Datablad:
- SN74BCT8374ADW.pdf
Introduktion
BYCHIPS er strømforsyningsdistributøren for SN74BCT8374ADW, vi har lagrene til omgående forsendelse og også tilgængelig for lang tid levering. Send venligst din købsplan til SN74BCT8374ADW via e-mail, vil vi give dig den bedste pris i henhold til din plan.
specifikationer
| Forsyningsspænding: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Device Package: | 24-SOIC |
| Serie: | 74BCT |
| Emballage: | Tube |
| Pakke / tilfælde: | 24-SOIC (0.295", 7.50mm Width) |
| Andre navne: | 296-33849-5 SN74BCT8374ADW-ND SN74BCT8374ADWE4 SN74BCT8374ADWE4-ND SN74BCT8374ADWG4 SN74BCT8374ADWG4-ND |
| Driftstemperatur: | 0°C ~ 70°C |
| Antal bitter: | 8 |
| Monteringstype: | Surface Mount |
| Fugtfølsomhedsniveau (MSL): | 1 (Unlimited) |
| Fabrikantens standard ledetid: | 6 Weeks |
| Producentens varenummer: | SN74BCT8374ADW |
| Logik Type: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Udvidet beskrivelse: | Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC |
| Beskrivelse: | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Email: | [email protected] |
Relaterede dele til SN74BCT8374ADW
| Billede | Varenummer | producenter | Beskrivelse | Udsigt |
|---|---|---|---|---|
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Forespørgsel |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørgsel |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Forespørgsel |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Forespørgsel |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørgsel |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørgsel |
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Forespørgsel |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Forespørgsel |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørgsel |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørgsel |
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