Købe SN74LVTH182646APM med BYCHPS
Køb med garanti
SN74LVTH182646APM
- Varenummer:
- SN74LVTH182646APM
- Fabrikant:
- Beskrivelse:
- IC SCAN-TEST-DEV/XCVR 64-LQFP
- Blyfri Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgængelig mængde:
- 18956 Pieces
- Datablad:
- SN74LVTH182646APM.pdf
Introduktion
BYCHIPS er strømforsyningsdistributøren for SN74LVTH182646APM, vi har lagrene til omgående forsendelse og også tilgængelig for lang tid levering. Send venligst din købsplan til SN74LVTH182646APM via e-mail, vil vi give dig den bedste pris i henhold til din plan.
specifikationer
| Forsyningsspænding: | 2.7 V ~ 3.6 V |
|---|---|
| Leverandør Device Package: | 64-LQFP (10x10) |
| Serie: | 74LVTH |
| Emballage: | Tray |
| Pakke / tilfælde: | 64-LQFP |
| Andre navne: | 74LVTH182646APMG4 74LVTH182646APMG4-ND |
| Driftstemperatur: | -40°C ~ 85°C |
| Antal bitter: | 18 |
| Monteringstype: | Surface Mount |
| Fugtfølsomhedsniveau (MSL): | 2 (1 Year) |
| Fabrikantens standard ledetid: | 11 Weeks |
| Producentens varenummer: | SN74LVTH182646APM |
| Logik Type: | ABT Scan Test Device With Transceivers and Registers |
| Udvidet beskrivelse: | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
| Beskrivelse: | IC SCAN-TEST-DEV/XCVR 64-LQFP |
| Email: | [email protected] |
Relaterede dele til SN74LVTH182646APM
| Billede | Varenummer | producenter | Beskrivelse | Udsigt |
|---|---|---|---|---|
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Forespørgsel |
|
SN74LVTH182504APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH18502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH182502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH18511DGGR | Texas Instruments | IC UNIV BUS TXRX 18BIT 48TSSOP | Forespørgsel |
|
SN74LVTH18502APMR | Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | Forespørgsel |
|
SN74LVTH18504APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH182512DGGR | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | Forespørgsel |
|
SN74LVTH182502APMR | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Forespørgsel |
|
SN74LVTH18514DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Forespørgsel |
|
SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | Forespørgsel |
|
SN74LVTH18512DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Forespørgsel |
|
SN74LVTH18502APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørgsel |
|
SN74LVTH18504APMR | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Forespørgsel |
Laast News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog